Patent Disputes Expert Witnesses
Patent disputes expert witnesses and consultants listed here may be able to form expert opinions, draft expert witness reports, provide expert witness testimony at deposition and/or trial as or serve as consulting (non-testifying) experts on patent disputes. The patent disputes expert witness listings on this page are typically from fields/areas of expertise such as: Electrical Engineering, Epidemiology, Photography & Imaging, and Public Health.
Lawrence S Mayer, MD, MS, PhD
Lawrence Mayer, MD, MS, PhD
Laguna Beach, California
Epidemiology, Public Health
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Biostatistics, Statistics, Causality, Study Design, Model Evaluation, Malpractice, Toxic Torts, Patent Disputes, Covid-19, Statistical Models, Data Analysis
Joseph Dagher
Imaging Physics & Image Processing Expert Witness
Falls Church, Virginia
Electrical Engineering, Photography & Imaging
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Signal Processing, Image Processing, Video Processing, Optics, Imaging, Cameras, Sensors, Medical Imaging, Compression, Image Quality, Image Reconstruction, Image and Video Analytics, Magnetic Resonance Imaging (MRI), Patent Disputes, Patent Infringement, Deep Fake Detection, DeepFakes
Dr. Dagher’s Expert Witness experience spans the entire field of Imaging Systems, from the design of Optical & Sensor Systems to the research and development of Image and Video Processing and Analysis Algorithms. Dr Dagher has 5 year experience in depositions, writing reports & rebuttals, valuations, patents and intellectual property. Dr. Dagher has testified 5 times on topics ranging from Inter-Pares Patent disputes, patent infringement, personal injury and class-action lawsuits.
Career highlights include:
— More than 25 years of Research and Development experience in Imaging Science. Dr. Dagher is currently Director of Research & Development at a startup company in the DC area.
— Formal education & decades of hands-on experience in Signal and Image Processing such as Image and Video Compression, Computer Vision, Image Enhancement, Image forensics, Image Analysis, Machine Vision, Image Reconstruction, Image Quality, Inverse Problems, Deep Fake Generation and Deep Fake Detecti...
